Energy minimization for hybrid BIST in a system-on-chip test environment

Raimund Ubar, Tatjana Shchenova, Gert Jervan, Zebo Peng. Energy minimization for hybrid BIST in a system-on-chip test environment. In 10th European Test Symposium (ETS 2005), May 22-25, 2005, Tallinn, Estonia. pages 2-7, IEEE, 2005. [doi]

Abstract

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