Hiroki Ueno, Kazuteru Namba. Construction of a soft error (SEU) hardened Latch with high critical charge. In 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016, Storrs, CT, USA, September 19-20, 2016. pages 27-30, IEEE Computer Society, 2016. [doi]
Abstract is missing.