System for Online Detection of Aberrant Responses in E-Testing

Maomi Ueno, Toshio Okamoto. System for Online Detection of Aberrant Responses in E-Testing. In The 8th IEEE International Conference on Advanced Learning Technologies, ICALT 2008, July 1st- July 5th, 2008, Santander, Cantabria, Spain. pages 824-828, IEEE, 2008. [doi]

Authors

Maomi Ueno

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Toshio Okamoto

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