System for Online Detection of Aberrant Responses in E-Testing

Maomi Ueno, Toshio Okamoto. System for Online Detection of Aberrant Responses in E-Testing. In The 8th IEEE International Conference on Advanced Learning Technologies, ICALT 2008, July 1st- July 5th, 2008, Santander, Cantabria, Spain. pages 824-828, IEEE, 2008. [doi]

@inproceedings{UenoO08a,
  title = {System for Online Detection of Aberrant Responses in E-Testing},
  author = {Maomi Ueno and Toshio Okamoto},
  year = {2008},
  doi = {10.1109/ICALT.2008.171},
  url = {http://dx.doi.org/10.1109/ICALT.2008.171},
  tags = {testing, e-science},
  researchr = {https://researchr.org/publication/UenoO08a},
  cites = {0},
  citedby = {0},
  pages = {824-828},
  booktitle = {The 8th IEEE International Conference on Advanced Learning Technologies, ICALT 2008, July 1st- July 5th, 2008, Santander, Cantabria, Spain},
  publisher = {IEEE},
}