Parth C. Upadhyay, Lokesh Karanam, John A. Lory, Guilherme N. DeSouza. Classifying Cover Crop Residue from RGB Images: A Simple SVM versus a SVM Ensemble. In IEEE Symposium Series on Computational Intelligence, SSCI 2021, Orlando, FL, USA, December 5-7, 2021. pages 1-7, IEEE, 2021. [doi]
Abstract is missing.