Taiki Utsunomiya, Ryu Hoshino, Kohei Miyase, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara. Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits. In IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022. pages 43-48, IEEE, 2022. [doi]
Abstract is missing.