Ismail Uysal, Jean-Pierre Emond, Gisele Bennett. Tag testing methodology for RFID enabled temperature tracking and shelf life estimation. In 2011 IEEE International Conference on RFID-Technologies and Applications, RFID-TA 2011, Sitges, Spain, September 15-16, 2011. pages 8-15, IEEE, 2011. [doi]
Abstract is missing.