Satya Gautam Vadlamudi, P. P. Chakrabarti, Dipankar Das 0002, Purnendu Sinha. A framework for early stage quality-fault tolerance analysis of embedded control systems. In Proceedings of the 2011 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2011, Hong Kong, China, June 27-30 2011. pages 315-322, IEEE, 2011. [doi]
Abstract is missing.