A methodology for validating digital circuits with mutation testing

Patrice Vado, Yvon Savaria, Yannick Zoccarato, Chantal Robach. A methodology for validating digital circuits with mutation testing. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 343-346, IEEE, 2000. [doi]

Abstract

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