Patrice Vado, Yvon Savaria, Yannick Zoccarato, Chantal Robach. A methodology for validating digital circuits with mutation testing. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 343-346, IEEE, 2000. [doi]
@inproceedings{VadoSZR00,
title = {A methodology for validating digital circuits with mutation testing},
author = {Patrice Vado and Yvon Savaria and Yannick Zoccarato and Chantal Robach},
year = {2000},
doi = {10.1109/ISCAS.2000.857100},
url = {https://doi.org/10.1109/ISCAS.2000.857100},
researchr = {https://researchr.org/publication/VadoSZR00},
cites = {0},
citedby = {0},
pages = {343-346},
booktitle = {IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings},
publisher = {IEEE},
}