Ashkan Vakil, Farzad Niknia, Ali Mirzaeian, Avesta Sasan, Naghmeh Karimi. Learning Assisted Side Channel Delay Test for Detection of Recycled ICs. In ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, Tokyo, Japan, January 18-21, 2021. pages 455-462, ACM, 2021. [doi]
Abstract is missing.