Alessandro Vallero, Alessandro Savino, Alberto Carelli, Stefano Di Carlo. Bayesian models for early cross-layer reliability analysis and design space exploration. In Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos, editors, 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019. pages 143-146, IEEE, 2019. [doi]
Abstract is missing.