Alessandro Vallero, Sotiris Tselonis, Nikos Foutris, Manolis Kaliorakis, Maha Kooli, Alessandro Savino, Gianfranco Politano, Alberto Bosio, Giorgio Di Natale, Dimitris Gizopoulos, Stefano Di Carlo. Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview. Microprocessors and Microsystems, 39(8):1204-1214, 2015. [doi]
Abstract is missing.