Jim Vana, Alexander Barr, Richard Scherer, Abhay Joshi. High Speed I/O Test Cable Assembly Interfaces for Next Generation Multi-Gigabit Serial Protocols. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1, IEEE, 2009. [doi]
Abstract is missing.