Modelling local and global phenomena with sparse Gaussian processes

Jarno Vanhatalo, Aki Vehtari. Modelling local and global phenomena with sparse Gaussian processes. In David A. McAllester, Petri Myllymäki, editors, UAI 2008, Proceedings of the 24th Conference in Uncertainty in Artificial Intelligence, July 9-12, 2008, Helsinki, Finland. pages 571-578, AUAI Press, 2008. [doi]

Abstract

Abstract is missing.