Tomas Vantuch, Tomas Burianek, Stanislav Misák. A Novel Method for Detection of Covered Conductor Faults by PD-Pattern Evaluation. In Ajith Abraham, Xin-hua Jiang, Václav Snásel, Jeng-Shyang Pan, editors, Intelligent Data Analysis and Applications, Proceedings of the Second Euro-China Conference on Intelligent Data Analysis and Applications, ECC 2015, Jun 29, 2015 - Jul 1, 2015, Technical University of Ostrava, Czech Republic. Volume 370 of Advances in Intelligent Systems and Computing, pages 133-142, Springer, 2015. [doi]
Abstract is missing.