Generation of testable designs from behavioral descriptions using high level synthesis tools

K. K. Varma, P. Vishakantaiah, J. A. Abraham. Generation of testable designs from behavioral descriptions using high level synthesis tools. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 124-130, IEEE, 1993. [doi]

Abstract

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