High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices

Vesselin K. Vassilev, S. Jenei, Guido Groeseneken, R. Venegas, S. Thijs, V. De Heyn, M. Natarajan Iyer, Michiel Steyaert, H. E. Maes. High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices. Microelectronics Reliability, 43(7):1011-1020, 2003. [doi]

Abstract

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