Vassilios D. Vassios, Argyrios T. Hatzopoulos, Ioannis G. Intzes, Dimitrios K. Papakostas. Parametric Fault Detection of Analog Circuits by Utilizing the Fundamental RMS of the Supply Current Fluctuation. In 13th International Conference on Modern Circuits and Systems Technologies, MOCAST 2024, Sofia, Bulgaria, June 26-28, 2024. pages 1-4, IEEE, 2024. [doi]
Abstract is missing.