Analog/Digital Testing of Loaded Boards Without Dedicated Test Points

Christophe Vaucher, Louis Balme. Analog/Digital Testing of Loaded Boards Without Dedicated Test Points. In Proceedings IEEE International Test Conference 1996, Test and Design Validity, Washington, DC, USA, October 20-25, 1996. pages 325-332, IEEE Computer Society, 1996.

Abstract

Abstract is missing.