On-Chip Measurement of the Jitter Transfer Function of Charge-Pump Phase-Locked Loops - researchr publication

researchr

You are not signed in
Sign in
Sign up

Benoît R. Veillette, Gordon W. Roberts. On-Chip Measurement of the Jitter Transfer Function of Charge-Pump Phase-Locked Loops. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 776-785, IEEE Computer Society, 1997.

Abstract is missing.

runs on WebDSL