Maria Veizaga, Sophie Bercu, Claude Delpha, Demba Diallo, Ludovic Bertin. Classification of Voltage Sag Causes based on Instantaneous Symmetrical Components using 1NN and Dynamic Time Warping. In IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society, Toronto, ON, Canada, October 13-16, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.