Jyothi Velamala, Ketul Sutaria, Hirofumi Shimizu, Hiromitsu Awano, Takashi Sato, Yu Cao. Statistical aging under dynamic voltage scaling: A logarithmic model approach. In Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012, San Jose, CA, USA, September 9-12, 2012. pages 1-4, IEEE, 2012. [doi]
Abstract is missing.