TAN: a packet switched network for VLSI testing

Sundharesan Vengatachalam, Mehrdad Nourani, Mohammad J. Akhbarizadeh. TAN: a packet switched network for VLSI testing. In Ronald P. Luijten, Luiz A. DaSilva, E. K. Park, editors, Proceedings of the 12th International Conference on Computer Communications and Networks, ICCCN 2003, 20-22 October, 2003, Double Tree Lincoln Centre, Dallas, Texas, USA. pages 605-608, IEEE, 2003. [doi]

Abstract

Abstract is missing.