Srikanth Venkataraman, Srihari Sivaraj, Enamul Amyeen, Sangbong Lee, Ajay Ojha, Ruifeng Guo. An Experimental Study of N-Detect Scan ATPG Patterns on a Processor. In 22nd IEEE VLSI Test Symposium (VTS 2004), 25-29 April 2004, Napa Valley, CA, USA. pages 23-30, IEEE Computer Society, 2004. [doi]
Abstract is missing.