Ramachandran Venkatasubramanian, Doohwang Chang, Sule Ozev. Analysis and Mitigation of Electromigration in RF Circuits: An LNA Case Study. In 16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway. pages 215, IEEE Computer Society, 2011. [doi]
Abstract is missing.