Sriramkumar Venugopalan, Vivek Joshi, Luis Zamudio, Matthias Goldbach, Gert Burbach, Ralf Van Bentum, Sriram Balasubramanian. SRAM read current variability and its dependence on transistor statistics. In Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, San Jose, CA, USA, September 22-25, 2013. pages 1-4, IEEE, 2013. [doi]
Abstract is missing.