Ingrid Verbauwhede, Roel Maes. Physically unclonable functions: manufacturing variability as an unclonable device identifier. In David Atienza, Yuan Xie, José L. Ayala, Ken S. Stevens, editors, Proceedings of the 21st ACM Great Lakes Symposium on VLSI 2010, Lausanne, Switzerland, May 2-6, 2011. pages 455-460, ACM, 2011. [doi]
Abstract is missing.