Martin Versen, Achim Schramm, Jan Schnepp, Dorina Diaconescu. Test Instrumentation for a Laser Scanning Localization Technique for Analysis of High Speed DRAM devices. In Design, Automation and Test in Europe, DATE 2008, Munich, Germany, March 10-14, 2008. pages 776-779, 2008. [doi]
Abstract is missing.