Luigi C. Viagrande, Filippo L. M. Milotta, Paola Giuffrè, Giuseppe Bruno, Daniele Vinciguerra, Giovanni Gallo. Semisupervised Classification of Anomalies Signatures in Electrical Wafer Sorting (EWS) Maps. In Giovanni Maria Farinella, Petia Radeva, José Braz, editors, Proceedings of the 15th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications, VISIGRAPP 2020, Volume 5: VISAPP, Valletta, Malta, February 27-29, 2020. pages 278-285, SCITEPRESS, 2020. [doi]
Abstract is missing.