Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel. SoC Yield Improvement: Redundant Architectures to the Rescue?. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1, IEEE, 2008. [doi]
Abstract is missing.