Andrea Vici, Felice Russo, Nicola Lovisi, Aldo Marchioni, Antonio Casella, Fernanda Irrera. Generation of oxide traps in Back-Side-Illuminated CMOS Image Sensors and impact on reliability. In 49th European Solid-State Device Research Conference, ESSDERC 2019, Cracow, Poland, September 23-26, 2019. pages 234-237, IEEE, 2019. [doi]
Abstract is missing.