Differential Metric based Deep Learning Methodology for Non-Profiled Side Channel Analysis

Gonella Vijayakanthi, Jaganath Prasad Mohanty, Ayas Kanta Swain, Kamalakanta Mahapatra. Differential Metric based Deep Learning Methodology for Non-Profiled Side Channel Analysis. In IEEE International Symposium on Smart Electronic Systems, iSES 2021, Jaipur, India, December 18-22, 2021. pages 200-203, IEEE, 2021. [doi]

Abstract

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