Hector Villacorta, Charles F. Hawkins, Víctor H. Champac, Jaume Segura, Roberto Gómez. Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths. IEEE Design & Test of Computers, 30(6):70-79, 2013. [doi]
@article{VillacortaHCSG13,
title = {Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths},
author = {Hector Villacorta and Charles F. Hawkins and Víctor H. Champac and Jaume Segura and Roberto Gómez},
year = {2013},
doi = {10.1109/MDT.2013.2238578},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2013.2238578},
researchr = {https://researchr.org/publication/VillacortaHCSG13},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {30},
number = {6},
pages = {70-79},
}