Voltage and Temperature Scalable Standard Cell Leakage Models Based on Stacks for Statistical Leakage Characterization - researchr publication

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Janakiraman Viraraghavan, Bishnu Prasad Das, Bharadwaj Amrutur. Voltage and Temperature Scalable Standard Cell Leakage Models Based on Stacks for Statistical Leakage Characterization. In 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India. pages 667-672, IEEE Computer Society, 2008. [doi]

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