Abhinav Vishnu, Hubertus van Dam, Nathan R. Tallent, Darren J. Kerbyson, Adolfy Hoisie. Fault Modeling of Extreme Scale Applications Using Machine Learning. In 2016 IEEE International Parallel and Distributed Processing Symposium, IPDPS 2016, Chicago, IL, USA, May 23-27, 2016. pages 222-231, IEEE Computer Society, 2016. [doi]
Abstract is missing.