Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee. A Signature Test Framework for Rapid Production Testing of RF Circuits. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 186-191, IEEE Computer Society, 2002. [doi]
Abstract is missing.