Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao. Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 903-912, IEEE Computer Society, 1997.
Abstract is missing.