Ellen M. Voorhees. On Building Fair and Reusable Test Collections using Bandit Techniques. In Alfredo Cuzzocrea, James Allan, Norman W. Paton, Divesh Srivastava, Rakesh Agrawal 0001, Andrei Z. Broder, Mohammed J. Zaki, K. Selçuk Candan, Alexandros Labrinidis, Assaf Schuster, Haixun Wang, editors, Proceedings of the 27th ACM International Conference on Information and Knowledge Management, CIKM 2018, Torino, Italy, October 22-26, 2018. pages 407-416, ACM, 2018. [doi]
Abstract is missing.