Concurrent online BIST for sequential circuits exploiting input reduction and output space compaction

Ioannis Voyiatzis. Concurrent online BIST for sequential circuits exploiting input reduction and output space compaction. In Giorgio Di Natale, editor, 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. pages 1-2, IEEE, 2014. [doi]

Abstract

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