Ioannis Voyiatzis, K. Axiotis, N. Papaspyrou, H. Antonopoulou, Costas Efstathiou. Test Set Embedding into Low-Power BIST Sequences Using Maximum Bipartite Matching. In 16th Panhellenic Conference on Informatics, PCI 2012, Piraeus, Greece, October 5-7, 2012. pages 74-79, IEEE Computer Society, 2012. [doi]
Abstract is missing.