Ioannis Voyiatzis, Dimitris Gizopoulos, Antonis M. Paschalis. An Input Vector Monitoring Concurrent BIST scheme exploiting . In 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 24-26 June 2009, Sesimbra-Lisbon, Portugal. pages 206-207, IEEE, 2009. [doi]
Abstract is missing.