Stefan Wagner. A model and sensitivity analysis of the quality economics of defect-detection techniques. In Lori L. Pollock, Mauro Pezzè, editors, Proceedings of the ACM/SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2006, Portland, Maine, USA, July 17-20, 2006. pages 73-84, ACM, 2006. [doi]
Abstract is missing.