Takao Waho, Akinori Yamada, Hiroki Okuyama, Victor Khorenko, Thai Do, Werner Prost. A Four-Resonant-Tunneling-Diode (4RTD) NAND/NOR Logic Gate. In International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA. pages 129-132, IEEE, 2007. [doi]