Imran Wali, Bastien Deveautour, Arnaud Virazel, Alberto Bosio, Patrick Girard, Matteo Sonza Reorda. A low-cost susceptibility analysis methodology to selectively harden logic circuits. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-2, IEEE, 2016. [doi]
Abstract is missing.