Roy Wallace, Mitchell McLaren, Christopher McCool, Sébastien Marcel. Inter-session variability modelling and joint factor analysis for face authentication. In Anil K. Jain, Arun Ross, Salil Prabhakar, Jaihie Kim, editors, 5th IAPR International Conference on Biometrics, ICB 2012, New Delhi, India, March 29 - April 1, 2012. pages 1-8, IEEE, 2011. [doi]
Abstract is missing.