Reliability of dissimilarity measures for multi-voxel pattern analysis

Alexander Walther, Hamed Nili, Naveed Ejaz, Arjen Alink, Nikolaus Kriegeskorte, Jörn Diedrichsen. Reliability of dissimilarity measures for multi-voxel pattern analysis. NeuroImage, 137:188-200, 2016. [doi]

Abstract

Abstract is missing.