Xingyi Wang, Li Jiang 0002, Krishnendu Chakrabarty. LSTM-based Analysis of Temporally- and Spatially-Correlated Signatures for Intermittent Fault Detection. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.