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Haibin Wang, Xixi Dai, Younis Mohammed Younis Ibrahim, Hongwen Sun, Issam Nofal, Li Cai, Gang Guo, Zicai Shen, Li Chen 0001. A Layout-Based Rad-Hard DICE Flip-Flop Design. J. Electronic Testing, 35(1):111-117, 2019. [doi]
Abstract is missing.