P-Alloc: Process-Variation Tolerant Reliability Management for 3D Charge-Trapping Flash Memory

Yi Wang, Lisha Dong, Rui Mao. P-Alloc: Process-Variation Tolerant Reliability Management for 3D Charge-Trapping Flash Memory. ACM Trans. Embedded Comput. Syst., 16(5), 2017. [doi]

Abstract

Abstract is missing.